SCC20 - Test and Diagnosis for Electronic Systems

Members

SCC20 Organization

SCC20 Organization as of May 12, 2025

Working Groups

SCC20 Working Groups

SCC20 Working Groups as of February 25, 2025

Participate

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Officers
Chair Mike Seavey ([email protected])
Vice Chair Chris Gorringe ([email protected])
Secretary / Treasurer Teresa Lopes ([email protected])
Appointed Members
DoD Mike Malesich ([email protected])
MoD Paul Grealis ([email protected])
Alternate: Alison Kennedy ([email protected])
Consultant Ion Neag ([email protected])
Consultant John Sheppard ([email protected])
Working Group Chairs
IEEE P1671
Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via eXtensible Markup Language
Mike Seavey ([email protected])
IEEE P1871.3
Recommended Practice for Using JavaScript Object Notation (JSON) with XML-based Data Models for Test and Diagnosis for Electronic Systems
Anand Jain ([email protected])
IEEE P2848
Prognostics and Health Management for ATS
John Sheppard ([email protected])
IEEE-1232
System Diagnostic Data and Services (Revision of IEEE 1232-2010 AI-ESTATE)
John Sheppard ([email protected])
Study Group Chairs
ATML-compatible representation in SysML of test requirements information for electronic systems – continuation Ion Neag ([email protected])